SOLARXPLOT
A powerful tool for visualizing and analyzing photovoltaic device metrics with precision and ease. Streamline your solar cell research with our intuitive interface and comprehensive analysis features.
Download Now Learn More
A powerful tool for visualizing and analyzing photovoltaic device metrics with precision and ease. Streamline your solar cell research with our intuitive interface and comprehensive analysis features.
Download Now Learn More
Comprehensive current-voltage characteristic analysis with automatic parameter extraction including Jsc, Voc, FF, and PCE.
Advanced X-ray diffraction pattern analysis with peak identification and phase analysis capabilities.
External quantum efficiency measurements with spectral response analysis and bandgap determination.
Advanced current-voltage characteristic analysis for photovoltaic devices.
Automatically extract and analyze short-circuit current density from your J-V measurements. Our software provides accurate determination of Jsc across multiple devices or conditions.
Precise determination of open-circuit voltage with advanced curve fitting techniques. Visualize and compare Voc values across multiple devices or conditions.
Calculate fill factor with high accuracy. Our software accounts to provide reliable FF values for your photovoltaic devices.
Comprehensive efficiency analysis with automatic calculation of power conversion efficiency. Compare performance across different device architectures and measurement conditions.
Advanced X-ray diffraction pattern analysis for material characterization.
Automatically identify and label diffraction peaks in your XRD patterns. Our software includes a comprehensive database of common photovoltaic materials for phase identification.
External Quantum Efficiency measurements for comprehensive device characterization.
Analyze the spectral response of your photovoltaic devices with high precision. Our software provides tools for:
